The 2008 International Conference on Nanoscience+Technology

The 2008 International Conference on Nanoscience + Technology (ICN+T) will provide an international forum for discussion of the latest developments in nanoscale science and technology and recent advances in scanning probe microscopy and related techniques. The ICN+T represents the convergence of the former International Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Techniques (STM) and Nano, which were first combined in Basel, Switzerland in 2006. (List of the former meeting sites.) This conference will cover a range of topics in nanoscale science and technology, addressing the interdisciplinary, international nature of this exciting and rapidly growing field. Topics to be covered include scanning probe microscopy/spectroscopy and related instrumentation, nanosystems, nanomechanics, nanomanipulation, nanomagnetism, nanooptics, nanowires, nanofluidics, nanobiotechnology, molecular electronics, quantum devices, and advances in materials and processing for nanotechnology and nanofabrication.